The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2026

Filed:

Oct. 26, 2023
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Hye Jin S. Kim, Daejeon, KR;

Ji Yeon Son, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/62 (2017.01); G01C 3/02 (2006.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G06T 7/62 (2017.01); G01C 3/02 (2013.01); G06T 7/50 (2017.01); G06T 2207/20081 (2013.01);
Abstract

Disclosed are an apparatus and method for measuring a dimension. The method of measuring a dimension according to an aspect of the present invention includes photographing a target object and generating an image, normalizing the image of the target object, generating normalized estimated dimension information about the target object from the normalized image of the target object using a pre-trained dimension prediction model, and converting the normalized estimated dimension information of the target object into estimated dimension information of the target object.


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