Chu-Pei, Taiwan

Hung-Yi Lin


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2015-2018

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2 patents (USPTO):Explore Patents

Title: Innovations by Inventor Hung-Yi Lin

Introduction

Hung-Yi Lin is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of testing equipment for LED chips, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of probe cards and testing apparatuses.

Latest Patents

Hung-Yi Lin's latest patents include a probe card and test equipment designed for LED chips of flip-chip type. The probe card features a circuit board with a mounting surface and lateral edge, along with two probes and a fixing seat. Each probe is designed with a connecting portion, extending portion, cantilever portion, and contacting portion, allowing for effective contact with the LED chip. The test equipment is equipped with the probe card and is specifically designed to test the optical characteristics of the LED chip.

Another significant invention is a probing apparatus that includes a rotating device with multiple platforms for supporting devices under test (DUTs). This apparatus features a probe device with a lifting stage that can move between two positions, along with a heating device that moves with the lifting stage. This innovative design allows for simultaneous heating and testing of the DUTs, enhancing the overall testing process.

Career Highlights

Hung-Yi Lin is currently employed at Mpi Corporation, where he continues to develop innovative solutions in the field of testing equipment. His work has been instrumental in advancing the technology used in LED chip testing.

Collaborations

He collaborates with talented coworkers, including Hsiu-Wei Lin and Chia-Tai Chang, who contribute to the innovative environment at Mpi Corporation.

Conclusion

Hung-Yi Lin's contributions to the field of testing equipment for LED chips demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the technology and a drive to improve testing methodologies.

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