The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2015

Filed:

Mar. 15, 2013
Applicant:

Mpi Corporation, Chu-Pei, Hsinchu Shien, TW;

Inventors:

Hsiu-Wei Lin, Chu-Pei, TW;

Yu-Che Cheng, Chu-Pei, TW;

Hung-Yi Lin, Chu-Pei, TW;

Assignee:

MPI Corporation, Hsinchu Shien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/04 (2006.01); G01R 31/28 (2006.01); G01R 31/01 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/0408 (2013.01); G01R 31/01 (2013.01); G01R 31/2635 (2013.01); G01R 31/2642 (2013.01); G01R 31/2875 (2013.01);
Abstract

A probing apparatus includes a rotating device having a plurality of platforms for supporting DUTs, a probe device having a lifting stage movable between first and second positions, and a heating device mounted to the lifting stage so as to move along with it. The platforms are synchronously revolvable in a way that the platforms move to a test position sequentially The heating device is configured in a manner that when the lifting stage moves to the first position, the heating device is located away from the platform at the test position, and when the lifting stage moves to the second position, the heating device contacts and heats the platform at the test position. Therefore, the heating device and the probe device are movable simultaneously for heating up the platform and testing the DUT respectively.


Find Patent Forward Citations

Loading…