Company Filing History:
Years Active: 2015-2018
Title: Hsiu-Wei Lin: Innovator in Probe Card Technology
Introduction
Hsiu-Wei Lin is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of probe card technology, holding a total of 2 patents. His work focuses on enhancing the testing capabilities of LED chips, particularly in flip-chip configurations.
Latest Patents
Hsiu-Wei Lin's latest patents include innovative designs for a probe card and a probing apparatus equipped with a heating device. The probe card is designed for contacting an LED chip of flip-chip type and features a circuit board with a mounting surface, two probes, and a fixing seat. Each probe consists of a connecting portion, an extending portion, a cantilever portion, and a contacting portion. The fixing seat is mounted on the circuit board, allowing for efficient testing of LED chips.
The probing apparatus includes a rotating device with multiple platforms for supporting devices under test (DUTs). It features a probe device with a lifting stage that can move between two positions, along with a heating device that moves with the lifting stage. This design allows for simultaneous heating of the platform and testing of the DUT, enhancing the efficiency of the testing process.
Career Highlights
Hsiu-Wei Lin is currently employed at Mpi Corporation, where he continues to develop innovative testing solutions. His work has significantly impacted the efficiency and effectiveness of LED chip testing.
Collaborations
Hsiu-Wei Lin collaborates with talented individuals such as Hung-Yi Lin and Chia-Tai Chang, contributing to a dynamic and innovative work environment.
Conclusion
Hsiu-Wei Lin's contributions to probe card technology and testing apparatuses demonstrate his commitment to innovation in the field. His patents reflect a deep understanding of the challenges in testing LED chips, paving the way for advancements in this critical area of technology.