This inventor holds 3 USPTO granted patents. Top assignee: Princeton Technology Corporation. Active years: 2010-2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010-2012
Title: Innovations of Inventor Hung-Wei Chen
Introduction
Hung-Wei Chen is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of circuit testing, holding a total of 3 patents. His work focuses on developing advanced testing apparatuses that enhance the efficiency and accuracy of electronic device testing.
Latest Patents
One of Hung-Wei Chen's latest patents is a circuit testing apparatus designed for testing devices under examination. This invention includes a logic tester and a signal-measuring module. The logic tester is connected to the device under testing, providing both a testing signal and a trigger signal. It determines the testing result based on a digital measuring outcome. The signal-measuring module, which is also connected to the device and the logic tester, measures a DC signal generated by the device after receiving the trigger signal, ultimately producing the digital measuring result.
Another significant patent is a testing circuit board intended for placing devices under test. This invention allows for further testing of the device using multiple testing signals generated by a tester. The testing circuit board consists of a circuit board with several connecting holes and multiple sets of sockets. These sockets are positioned on the connecting holes and connect electrically to the device under test through various connecting interfaces, facilitating the transfer of testing signals.
Career Highlights
Hung-Wei Chen is currently employed at Princeton Technology Corporation, where he continues to innovate in the field of electronic testing. His work has been instrumental in advancing the technology used in circuit testing, making it more reliable and efficient.
Collaborations
He has collaborated with notable coworkers, including Cheng-Yung Teng and Yung-Yu Wu, contributing to various projects that enhance the capabilities of testing technologies.
Conclusion
Hung-Wei Chen's contributions to circuit testing technology through his patents reflect his dedication to innovation in the field. His work continues to influence the industry, paving the way for more advanced testing solutions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile