The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 2010
Filed:
Sep. 11, 2007
Cheng-yung Teng, Taipei County, TW;
Hung-wei Chen, Taipei County, TW;
Cheng-Yung Teng, Taipei County, TW;
Hung-Wei Chen, Taipei County, TW;
Princeton Technology Corporation, Taipei County, TW;
Abstract
A circuit testing apparatus for testing a device under test is disclosed. The circuit testing apparatus includes a function generator, a signal measuring module and a determining module. The function generator is coupled to the device under test for providing a plurality of testing signals according to a predetermined manner. The signal measuring module is coupled to the device under test and the function module for measuring a plurality of measuring signals generated by the device under test according to the plurality of testing signals and generating a plurality of measuring results according to the predetermined manner. The determining module is coupled to the signal measuring module for determining a testing result for the device under test according to the plurality of measuring results.