Taipei, Taiwan

Hung-Chieh Chuang

This inventor holds 1 USPTO granted patent. Top assignee: National Taiwan University. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hung-Chieh Chuang. Retrieved from https://idiyas.com/inventor/hung-chieh-chuang-efjkgmje

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations of Hung-Chieh Chuang

Introduction

Hung-Chieh Chuang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of photodetection, particularly through his innovative patent. His work focuses on enhancing the capabilities of photodetectors, which are essential for measuring infrared radiation.

Latest Patents

Hung-Chieh Chuang holds a patent for a photodetector that features a metal-semiconductor junction designed for measuring infrared radiation. This photodetector is equipped with structures that achieve localized surface plasmon resonance at the metal-semiconductor junction, stimulated by incident light. As a result, the photodetector exhibits prompt response and broad spectral regions for photon detection. It is capable of detecting various powers of incident light across a wavelength range from visible to mid-infrared (300 nm to 20 μm).

Career Highlights

Chuang is affiliated with National Taiwan University, where he continues to advance his research and development in photodetection technologies. His work has implications for various applications, including environmental monitoring and optical communications.

Collaborations

Chuang has collaborated with notable colleagues, including Ching-Fuh Lin and Meng-Jie Lin, contributing to the advancement of their shared research interests.

Conclusion

Hung-Chieh Chuang's innovative work in photodetectors exemplifies the importance of advancements in technology for measuring infrared radiation. His contributions are paving the way for future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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