This inventor holds 1 USPTO granted patent. Top assignee: National Chung Cheng University. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Innovations of Hung-Chia Wang
Introduction
Hung-Chia Wang is a notable inventor based in Fongshan, Taiwan. He has made significant contributions to the field of image processing and depth measurement. His innovative work has led to the development of a unique patent that addresses the challenges of measuring depth and computing image defocus and blur status.
Latest Patents
Hung-Chia Wang holds a patent for an "Apparatus and method for measuring depth and method for computing image defocus and blur status." This invention provides an apparatus and method for measuring the depth of an object in a scene. It also includes a method for computing image defocus and blur status. The invention features an image analysis unit that receives a plurality of reference blurred images, analyzes them, and produces reference grey-scale distribution data corresponding to various reference depths. A blur comparison module then creates a blur model based on this data. The image analysis unit further analyzes a target blurred image to produce target grey-scale distribution data for comparison, ultimately generating depth information and corresponding blur status data.
Career Highlights
Hung-Chia Wang is affiliated with National Chung Cheng University, where he continues to engage in research and development in his field. His work has garnered attention for its practical applications in image analysis and processing.
Collaborations
He has collaborated with notable colleagues, including Huei-Yung Lin and Kai-Da Gu, contributing to advancements in their shared research interests.
Conclusion
Hung-Chia Wang's innovative contributions to image processing and depth measurement highlight his role as a significant inventor in the field. His patent reflects a commitment to advancing technology and improving image analysis techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile