The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Jul. 28, 2009
Huei-yung Lin, Min-Hsiung, TW;
Kai-da Gu, Yonghe, TW;
Hung-chia Wang, Fongshan, TW;
National Chung Cheng University, Chiayi County, TW;
Abstract
An apparatus and a method for measuring the depth of an object in a scene and a method for computing image defocus and blur status are provided. An image analysis unit receives a plurality of reference blurred images, analyzes the reference blurred images, produces reference grey-scale distribution data, where the reference blurred images corresponds to a plurality of reference depths, respectively. A blur comparison module produces a blur model according to the reference grey-scale distribution data and the corresponding reference depths. The image analysis unit receives a target blurred image, analyzes the target blurred image, and produces and transmits target grey-scale distribution data to the blur comparison module for comparing the target grey-scale distribution data according to the blur model, and producing depth information. Moreover, the present invention further produces the corresponding blur status data, used in defocus and blur computations, according to the defocused and blurred image.