This inventor holds 1 USPTO granted patent. Top assignee: Micron Technology Incorporated. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Hugh F. Stroupe: Innovator in Semiconductor Technology
Introduction
Hugh F. Stroupe is a notable inventor based in Boise, ID (US), recognized for his contributions to semiconductor technology. He holds a patent that showcases his innovative approach to improving the manufacturing processes of integrated circuits.
Latest Patents
Hugh F. Stroupe's patent, titled "Method and apparatus for selective removal of material from wafer alignment marks," presents a process and apparatus designed for the precise removal of materials, such as tungsten, from specific areas of a silicon wafer. This invention is particularly significant in the context of integrated circuit fabrication, where alignment marks are crucial for ensuring accuracy during the manufacturing process. The patent outlines a method that includes aligning the wafer area to an etchant dispensing apparatus, dispensing etchant onto the alignment mark, and effectively removing the material without damaging the wafer.
Career Highlights
Hugh F. Stroupe is associated with Micron Technology Incorporated, a leading company in the semiconductor industry. His work at Micron has contributed to advancements in wafer processing techniques, enhancing the efficiency and precision of integrated circuit production.
Collaborations
Throughout his career, Hugh has collaborated with notable colleagues, including Russell C. Zahorik and Guy F. Hudson. These collaborations have fostered a productive environment for innovation and development within the semiconductor field.
Conclusion
Hugh F. Stroupe's contributions to semiconductor technology, particularly through his patented methods for wafer processing, highlight his role as an influential inventor in the industry. His work continues to impact the efficiency of integrated circuit manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
