Cambridge, United Kingdom

Hugh Bradley

This inventor holds 2 USPTO granted patents. Top assignee: Siemens Industry Software Gmbh. Active years: 2019-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hugh Bradley. Retrieved from https://idiyas.com/inventor/hugh-bradley-js8imj17

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2019-2026

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2 patents (USPTO):Explore Patents

Title: Hugh Bradley - Innovator in Parametric Curve Modelling

Introduction

Hugh Bradley is a notable inventor based in Cambridge, GB. He has made significant contributions to the field of parametric curve modelling, showcasing his expertise through his innovative patent.

Latest Patents

Hugh Bradley holds a patent for a "Modelling method and system." This invention involves a method of deriving an offset profile of a parametric curve. The process includes generating an offset parametric curve based on user input and ensuring that no self-intersections occur in the created spline approximation. If self-intersections are present, the spline curve is modified until a valid offset profile is achieved.

Career Highlights

Hugh Bradley is associated with Siemens Industry Software GmbH, where he applies his skills in developing advanced modelling techniques. His work has been instrumental in enhancing the efficiency and accuracy of parametric curve representations.

Collaborations

Hugh collaborates with Patrick Baier, contributing to innovative projects within the company. Their teamwork exemplifies the synergy between skilled professionals in the field.

Conclusion

Hugh Bradley's contributions to parametric curve modelling through his patent and work at Siemens Industry Software GmbH highlight his role as an influential inventor. His innovative methods continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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