The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Apr. 05, 2016
Patrick Baier, Rockville, MD (US);
Hugh Bradley, Cambridge, GB;
Patrick Baier, Rockville, MD (US);
Hugh Bradley, Cambridge, GB;
Siemens Industry Software Limited, Camberley, GB;
Abstract
A method of deriving an offset profile of a parametric curve includes generating an offset parametric curve corresponding to a received profile of the product represented as a parametric curve based on user input. If no self-intersections in a created spline approximation of the generated offset parametric curve are present, the process is terminated and the offset parametric curve is output as the offset profile of the parametric curve. If self-intersection is present for the spline approximation, the spline curve is split at one or more self-intersections and removed from the spline approximation of the offset parametric curve to form a modified spline approximation. Computing the self-intersections in the modified spline approximation is repeated until no self-intersection is present. The modified spline approximation of the offset parametric curve is then output as the offset profile of the parametric curve.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile