Huei Che Yu is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of probe technology, holding a total of 2 patents. His work focuses on developing innovative solutions that enhance the functionality and manufacturing processes of inspection devices.

Latest Patents

Huei Che Yu's latest patents include a probe, inspection jig, inspection device, and a method of manufacturing the probe. The probe he developed enables control of a bending direction and can be manufactured with simplicity. The design features a substantially bar-like shape that extends linearly, consisting of a tip end portion, a body portion, and a base end portion. The body portion includes a first connection region with a thickness that gradually decreases away from the tip end portion, and a second connection region that decreases in thickness away from the base end portion. Notably, the width of the body portion is larger than the dimensions of both the tip end and base end portions.

Career Highlights

Throughout his career, Huei Che Yu has worked with several companies, including Nidec-Read Corporation and Sv Probe Technology Taiwan Co., Ltd. His experience in these organizations has contributed to his expertise in probe technology and inspection devices.

Collaborations

Huei Che Yu has collaborated with various professionals in his field, including Michio Kaida, who is a talented woman in the industry.

Conclusion

Huei Che Yu's innovative contributions to probe technology and inspection devices highlight his role as a significant inventor in the field. His patents reflect a commitment to enhancing manufacturing processes and device functionality.

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