This inventor holds 1 USPTO granted patent. Top assignee: Xi'an Jiaotong University. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: Huanhuan Lu: Innovator in Micro- and Nano-Scale Measurement Technologies
Introduction
Huanhuan Lu is a prominent inventor based in Xi'an, China. He has made significant contributions to the field of measurement technologies, particularly focusing on micro- and nano-scale materials. His innovative approach has led to the development of a unique measurement apparatus that enhances the efficiency and effectiveness of material testing.
Latest Patents
Huanhuan Lu holds a patent for a "Measurement apparatus for micro- and nano-scale material and measurement method thereof." This invention includes a transmission electron microscope that generates a magnetic field, along with a conductive flat punch and a sample arranged within that field. The sample consists of micro- and nano-scale materials. The apparatus allows for controllable lateral displacement of the conductive flat punch, driven by electromagnetic force, which significantly increases the utilization rate of equipment and reduces costs. Furthermore, the entire testing process can be observed in real time within the transmission electron microscope.
Career Highlights
Huanhuan Lu is affiliated with Xi'an Jiaotong University, where he continues to advance research in measurement technologies. His work has garnered attention for its practical applications in various scientific fields. His innovative spirit and dedication to research have positioned him as a key figure in his area of expertise.
Collaborations
Huanhuan Lu collaborates with esteemed colleagues, including Zhiwei Shan and Ju Li, who contribute to his research endeavors. Their combined expertise fosters a dynamic research environment that encourages innovation and discovery.
Conclusion
Huanhuan Lu's contributions to the field of micro- and nano-scale measurement technologies exemplify the impact of innovative thinking in scientific research. His patented apparatus not only enhances measurement processes but also sets a precedent for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile