Chiayi, Taiwan

Hua-Jen Chen

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2007.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Innovations of Hua-Jen Chen in Remote Mask Data Jobview Technology

Introduction

Hua-Jen Chen is a notable inventor based in Chiayi, Taiwan. He has made significant contributions to the field of semiconductor manufacturing through his innovative patent. His work focuses on enhancing the efficiency and accessibility of mask data jobview processes.

Latest Patents

Hua-Jen Chen holds a patent for a "Method for remote mask data jobview through a network." This innovative method provides 24-hour service, reduces cycle time, and lowers costs. Customers can access real-time mask data without the need to download entire pattern files. The method eliminates the necessity for expensive CAD/CAM software, requiring only a web browser for operation. The process involves storing a mask data file on a jobview computer, logging onto a web server from a customer computer, and using a web-based graphic mode emulator to operate the drawing software.

Career Highlights

Hua-Jen Chen is associated with Taiwan Semiconductor Manufacturing Company Limited, where he applies his expertise in semiconductor technology. His innovative approach has streamlined processes and improved service delivery in the industry.

Collaborations

Hua-Jen Chen has collaborated with notable colleagues, including Jiin-Feng Yeh and Chung-Sheng Lee. Their combined efforts contribute to advancements in semiconductor manufacturing technologies.

Conclusion

Hua-Jen Chen's innovative methods in remote mask data jobview technology represent a significant advancement in the semiconductor industry. His contributions enhance efficiency and accessibility, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
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