Hua Han

Title: Hua Han and a Method for Microscopic Image Acquisition

Introduction

Hua Han is an inventor based in Beijing, China, and is associated with the Chinese Academy of Sciences. Her work includes a patent for a method that supports microscopic image acquisition from sequential sections.

Latest Patents

Han’s listed patent is “Method for Microscopic Image Acquisition Based on Sequential Section.” It describes acquiring a sequential-section sample and its navigation image, then identifying and labeling the sample in that image using image processing and machine-learning methods. The method places the sample in a microscope and establishes a coordinate transformation between the navigation image and the microscope’s sampling space. It then uses the navigation image to guide a selected pixel point to the center of the microscope’s field of view. Under low-resolution viewing, the sample is located and acquisition parameters are associated with it. Finally, the method records the relative position between the center of a high-resolution acquisition region and the center identified through matching with a sample template. Han is credited with 1 patent in the information provided.

Career Highlights

The described invention combines image analysis, machine learning, coordinate mapping, and microscope navigation to help locate and acquire microscopic images of sequential-section samples. The available information identifies Han’s affiliation with the Chinese Academy of Sciences but does not provide further details about her role or career history.

Collaborations

Hongtu Ma and Guoqing Li are identified as Han’s coworkers. The information provided does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Hua Han’s listed patent presents a coordinated approach to locating sequential-section samples and acquiring microscopic images, linking navigation images with microscope positioning and high-resolution sampling.