The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Nov. 07, 2016
Institute of Automation, Chinese Academy of Sciences, Beijing, CN;
Institute of Automation, Chinese Academy of Sciences, Beijing, CN;
Abstract
A method for microscopic image acquisition based on a sequential slice. The method includes; acquiring a sample of the sequential slice and a navigation image thereof; identifying and labeling the sample of the sequential slice in the navigation image by utilizing methods of image processing and machine learning; placing the sample of the sequential slice in a microscope, establishing a coordinate transformation matrix for a navigation image-microscope actual sampling space coordinate, and navigating and locating a random pixel point in the navigation image to a center of the microscope's visual field; locating the sample of the sequential slice under a low resolution visual field, binding a sample acquisition parameter; based on the binding of the sample acquisition parameter, recording a relationship of relative of locations between a center point of a high resolution acquisition region and a center point after being matched with a sample template.