Hsiu-Tsang Lee

Title: Hsiu-Tsang Lee: Innovator in Automatic Alignment Technologies

Introduction

Hsiu-Tsang Lee is a prominent inventor based in Hsinchu, Taiwan. She has made significant contributions to the field of automatic alignment technologies, particularly in the context of membrane probers. With a total of 2 patents to her name, her work has advanced the precision and efficiency of alignment methods in semiconductor testing.

Latest Patents

One of Hsiu-Tsang Lee's latest patents focuses on automatic alignment methods for a membrane prober. This innovation involves designing and manufacturing alignment patterns on both the membrane prober and the wafer under test. The patterns are strategically created to acquire a first set of measurement data that provides relative position information when the prober contacts the wafer. A second set of measurement data can be obtained through a controlled movement between the prober and the wafer. The relative position, including translation offset and rotation angle, can be computed using the information derived from these two sets of measurement data. Additionally, the second set of measurement data may also be acquired by having two alignment pattern pairs that make contact in a single touch. More accurate alignment can be achieved by utilizing more pairs of alignment patterns.

Career Highlights

Hsiu-Tsang Lee is currently affiliated with the Industrial Technology Research Institute, where she continues to innovate and develop new technologies. Her work has been instrumental in enhancing the capabilities of automatic alignment systems, which are crucial for the semiconductor industry.

Collaborations

Hsiu-Tsang Lee has collaborated with notable colleagues, including Chung-Tao Chang and Steven J Yang. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Hsiu-Tsang Lee's contributions to automatic alignment technologies have positioned her as a key figure in the field. Her patents reflect her commitment to advancing precision in semiconductor testing, and her work continues to influence the industry positively.