Hsin-Po Wang

Title: Hsin-Po Wang: Innovator in Integrated Circuit Testing

Introduction

Hsin-Po Wang is a notable inventor based in Hsin-Chu, Taiwan. He has made significant contributions to the field of integrated circuit (IC) testing, showcasing his expertise through innovative patent developments.

Latest Patents

Wang holds a patent for an IC functional and delay fault testing method. This invention involves an integrated circuit tester that evaluates ICs with logic blocks communicating through clocked devices arranged into scan chains. The tester organizes a low-speed IC functional test into a series of uniform test cycles, allowing each clocked device to be clocked up to once per test cycle with adjustable clock signal edge timing. During the functional test, the tester executes a capture procedure, adjusting clock signal edge timing to ensure that the delay between clocking input and output signals of selected logic blocks is less than the test cycle period. This process determines whether the logic blocks can operate at high frequency without delay faults. Following each capture procedure, the tester performs a scan procedure to acquire data representing the states of logic block output signals, enabling the identification of any delay faults.

Career Highlights

Hsin-Po Wang is currently associated with SpringSoft, Inc., where he continues to advance the field of IC testing. His work has been instrumental in enhancing the reliability and performance of integrated circuits.

Collaborations

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Conclusion

Hsin-Po Wang's contributions to integrated circuit testing through his innovative patent demonstrate his significant role in the advancement of technology. His work continues to impact the industry positively.