Hsien-ta Hsu

Title: Hsien-ta Hsu: Innovator in Vertical Probing Technology

Introduction

Hsien-ta Hsu is an inventor based in Chu-Pei City, Taiwan. He has made significant contributions to the field of probing technology, particularly in the design and manufacturing of vertical probes and contacting members for semiconductor testing. Although he currently holds no granted patents, his innovative ideas are reflected in his latest patent applications.

Latest Patent Applications

Hsien-ta Hsu's latest patent applications include the following:

1. **Vertical Probe, Probe Head and Method of Making the Vertical Probe** - This application describes a vertical probe that features opposite first and third sides, as well as opposite second and fourth sides. The design allows for a planar extension from a body to a tip portion. The probe is engineered to contact small conductive contacts with enhanced current resistance, structural strength, lifespan, and processing accuracy. The application emphasizes the importance of avoiding breakage or shifting of the tip portion during vertical movement when applied to a probe head.

2. **Contact Probe and Contacting Member Thereof, Method of Manufacturing Contacting Member, Probe System Using the Contacting Member, Method of Testing Unpackaged Semiconductor Device, Tested Semiconductor Device and Method of Producing the Same** - This application outlines a contacting member of a contact probe designed for functionality testing of devices under test (DUT). The contacting member includes a body, a contact tip, and a tip transition section. The design ensures high precision and structural strength, with a focus on the height differences between various surfaces to facilitate effective testing.

Conclusion

Hsien-ta Hsu is an innovative inventor whose work in vertical probing technology showcases his commitment to advancing semiconductor testing methods. His latest patent applications reflect his dedication to improving the precision and reliability of probing systems.