Hsiao-Kang Li

Title: Hsiao-Kang Li: Innovator in Probe Card Technology

Introduction

Hsiao-Kang Li is a notable inventor based in Keelung, Taiwan. He has made significant contributions to the field of probe card technology, particularly with his innovative designs that enhance testing efficiency in semiconductor manufacturing.

Latest Patents

Hsiao-Kang Li holds a patent for a staggered probe card. This invention includes a staggered probe card and a conductive probe. The staggered probe card consists of an upper guide board and a lower guide board that are spaced apart. It features a plurality of conductive probes arranged in rows, which pass through both guide boards. Each conductive probe has an elongated structure that defines a longitudinal direction. The design includes a bottom surface and two long side surfaces connected to the edges of the bottom surface. Notably, the distance between the two long side surfaces gradually decreases in a tapering direction that extends away from the bottom surface. In two adjacent rows of conductive probes, the long side surfaces of the probes have a lateral interval that is non-parallel to the arrangement direction.

Career Highlights

Hsiao-Kang Li is associated with Chunghwa Precision Test Technology Co., Ltd., where he applies his expertise in developing advanced testing solutions. His work has been instrumental in improving the reliability and accuracy of semiconductor testing processes.

Collaborations

Hsiao-Kang Li collaborates with talented colleagues such as Kai-Chieh Hsieh and Ying-Ming Tiao. Their combined efforts contribute to the innovative advancements in the field of probe card technology.

Conclusion

Hsiao-Kang Li's contributions to the development of staggered probe cards exemplify his commitment to innovation in semiconductor testing. His work continues to influence the industry positively, showcasing the importance of inventive solutions in technology.