Yunlin, Taiwan

Hsiang-Ning Chen

This inventor holds 1 USPTO granted patent. Top assignee: Cm Visual Technology Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsiang-Ning Chen. Retrieved from https://idiyas.com/inventor/hsiang-ning-chen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Hsiang-Ning Chen: Innovator in Multi-Photon Excitation Techniques

Introduction

Hsiang-Ning Chen is a notable inventor based in Yunlin County, Taiwan. He has made significant contributions to the field of inspection methods through his innovative patent. His work focuses on utilizing advanced techniques to enhance the accuracy of material inspections.

Latest Patents

Hsiang-Ning Chen holds a patent titled "Method for inspecting an article and apparatus for measuring the article by multi-photon excitation technique." This patent describes a method for inspecting an article containing a target material. The process involves illuminating a sampling position of the article with a beam of laser light, which produces molecular excitation of the target material. The output light is then analyzed by a detector, allowing for precise measurements.

Career Highlights

Hsiang-Ning Chen is associated with Cm Visual Technology Corporation, where he applies his expertise in developing innovative inspection methods. His work has been instrumental in advancing the capabilities of material analysis and inspection technologies.

Collaborations

Hsiang-Ning Chen has collaborated with notable colleagues, including Wang-Yang Li and Ming-Che Chan. These partnerships have contributed to the development of cutting-edge technologies in the field.

Conclusion

Hsiang-Ning Chen's contributions to the field of inspection methods through his innovative patent demonstrate his commitment to advancing technology. His work continues to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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