The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2019

Filed:

Jan. 17, 2017
Applicant:

CM Visual Technology Corporation, Tainan, TW;

Inventors:

Wang-Yang Li, Tainan, TW;

Ming-Che Chan, Taichung, TW;

Hsiang-Ning Chen, Yunlin County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6404 (2013.01); G01N 21/6458 (2013.01); G02B 21/0076 (2013.01);
Abstract

A method for inspecting an article containing a target material is provided. A sampling position of the article is illuminated by a beam of laser light having a wavelength λ. Illumination focus to a focal point at the sampling position of the article to produce molecular excitation of the target material by simultaneous absorption of n incident photons of the beam of laser light, wherein n is equal to or greater than two. An output light exited from the article is analyzed by a detector, wherein the output light is of a wavelength range between 0.8λ and 1.2λ.


Find Patent Forward Citations

Loading…