Taichung, Taiwan

Ming-Che Chan


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Ming-Che Chan

Introduction

Ming-Che Chan is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of technology, particularly in the area of inspection methods for materials. His work is characterized by a focus on advanced techniques that enhance the accuracy and efficiency of measurements.

Latest Patents

Ming-Che Chan holds a patent for a "Method for inspecting an article and apparatus for measuring the article by multi-photon excitation technique." This innovative method involves illuminating a sampling position of an article with a laser beam, which excites the target material through the simultaneous absorption of multiple photons. The output light emitted from the article is then analyzed to provide insights into the material's properties. This patent showcases his expertise in utilizing cutting-edge technology for practical applications.

Career Highlights

Throughout his career, Ming-Che Chan has been associated with Cm Visual Technology Corporation, where he has played a pivotal role in developing advanced inspection technologies. His work has not only contributed to the company's growth but has also positioned him as a leader in his field. With a focus on innovation, he continues to push the boundaries of what is possible in material inspection.

Collaborations

Ming-Che Chan has collaborated with talented individuals such as Wang-Yang Li and Hsiang-Ning Chen. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Ming-Che Chan's contributions to the field of technology through his innovative patent and collaborative efforts highlight his importance as an inventor. His work continues to influence the industry and pave the way for future advancements in material inspection techniques.

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