This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Semiconductor Manufacturing Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Hsiang Ming Chang: Innovator in Defect Inspection Technology
Introduction
Hsiang Ming Chang is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of defect inspection technology, particularly in the semiconductor industry. His innovative approach combines machine learning with traditional inspection methods to enhance the accuracy of defect detection.
Latest Patents
Hsiang Ming Chang holds a patent for a "Defect inspection system employing an image enhancing model and a defect detection model, and method of using the same." This method involves patterning a hard mask over a target layer, capturing a low-resolution image of the hard mask, and enhancing this image using a first machine learning model. The enhanced image is then analyzed with a second machine learning model to determine if the target layer has defects. This innovative approach significantly improves the efficiency and reliability of defect detection in semiconductor manufacturing.
Career Highlights
Hsiang Ming Chang is currently employed at Taiwan Semiconductor Manufacturing Co., Ltd., a leading company in the semiconductor industry. His work focuses on developing advanced inspection systems that leverage machine learning technologies. His contributions have been instrumental in enhancing the quality control processes within the company.
Collaborations
Hsiang Ming Chang has collaborated with notable colleagues, including Chih-Kai Yang and Tung-Chin Wu. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Hsiang Ming Chang is a key figure in the field of defect inspection technology, with a focus on integrating machine learning into traditional methods. His patent and work at Taiwan Semiconductor Manufacturing Co., Ltd. highlight his commitment to advancing semiconductor manufacturing processes. His contributions are paving the way for more efficient and accurate defect detection systems in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile