Seoul, South Korea

Hoyoung Na

This inventor holds 1 USPTO granted patent. Top assignee: Nearthlab Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hoyoung Na. Retrieved from https://idiyas.com/inventor/hoyoung-na

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hoyoung Na: Innovator in Target Tracking Technology

Introduction

Hoyoung Na is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of target tracking technology. His innovative approach has led to the development of a unique device that enhances the accuracy and efficiency of tracking targets.

Latest Patents

Hoyoung Na holds a patent for a "Device for tracking target and system including the same." This device is designed to track a target by utilizing radar data and vision data from a camera. The system identifies the target and performs a guidance process to approach it. The device executes a first guidance process at a specific tracking time point and a second guidance process at a subsequent time point, allowing for different tracking methods.

Career Highlights

Hoyoung Na is associated with Nearthlab Inc., where he continues to innovate and develop advanced tracking technologies. His work has garnered attention for its practical applications in various industries.

Collaborations

Hoyoung Na collaborates with talented individuals such as Youngsuk Chung and Daeyun Shin. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Hoyoung Na's contributions to target tracking technology exemplify his innovative spirit and dedication to advancing the field. His patent and ongoing work at Nearthlab Inc. highlight his role as a key player in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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