Flower Mound, TX, United States of America

Hoyoung Chang

This inventor holds 1 USPTO granted patent. Top assignee: Stmicroelectronics Gmbh. Active years: 2003.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Hoyoung Chang: Innovator in Capacitive Sensor Technology

Introduction

Hoyoung Chang is a notable inventor based in Flower Mound, TX (US). He has made significant contributions to the field of capacitive sensor technology. His innovative approach has led to the development of a unique methodology for detecting surface damage on capacitive sensor integrated circuits.

Latest Patents

Hoyoung Chang holds a patent for a solution and methodology that detects minute surface damage or irregularities on the sensing surface of a capacitive sensor integrated circuit. The patent describes a process that involves acquiring a preliminary image of the capacitance readings for the sensor array. The sensing surface is then coated with an electrolyte solution, followed by the acquisition of an additional image while the surface is coated and/or after the electrolyte solution is removed. This innovative approach accelerates the manifestation of pixel degradation or failure caused by surface damage or irregularities. Defective regions are identified by changes in grayscale pixels in the preliminary image while the electrolyte coating is on the sensing surface and again after the coating is removed. Hoyoung Chang has 1 patent to his name.

Career Highlights

Hoyoung Chang is currently employed at STMicroelectronics GmbH, where he continues to work on advancements in sensor technology. His expertise and innovative mindset have positioned him as a valuable asset in the field.

Collaborations

Hoyoung Chang collaborates with Fred P. Lane, contributing to the development of cutting-edge technologies in capacitive sensing.

Conclusion

Hoyoung Chang's work in capacitive sensor technology exemplifies innovation and dedication to advancing the field. His patented methodology for detecting surface damage showcases his commitment to improving sensor performance and reliability.

Profile summary based on public USPTO records.
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