Tokyo, Japan

Housei Hirano


Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Housei Hirano: Innovator in SiC Single-Crystal Substrate Technology

Introduction

Housei Hirano is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of semiconductor materials, particularly in the development of silicon carbide (SiC) single-crystal substrates. His innovative work has implications for improving device yield and stability in various applications.

Latest Patents

Hirano holds a patent for a high-quality SiC single-crystal substrate and the method of producing it. This invention provides a seed crystal for producing the high-quality SiC single-crystal substrate. The method enables the improvement of device yield and stability, which is crucial for advancing semiconductor technology. The patent specifies that when the SiC single-crystal substrate is divided into 5-mm square regions, the regions with dislocation pairs or rows having intervals of 5 micrometers or less should account for 50% or less of all such regions within the substrate surface. Additionally, the dislocation density in the substrate of dislocations other than the dislocation pairs is set at 8,000/cm.

Career Highlights

Hirano is affiliated with Nippon Steel Corporation, where he continues to work on advancing semiconductor materials. His research and development efforts have positioned him as a key figure in the industry, contributing to the growth of high-performance materials.

Collaborations

Hirano has collaborated with notable colleagues, including Tatsuo Fujimoto and Kohei Tatsumi. These partnerships have fostered innovation and have been instrumental in the development of new technologies in the semiconductor field.

Conclusion

Housei Hirano's work in SiC single-crystal substrate technology exemplifies the impact of innovative thinking in the semiconductor industry. His contributions continue to influence advancements in device performance and stability.

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