Albuquerque, NM, United States of America

Hossein Hamooni

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hossein Hamooni. Retrieved from https://idiyas.com/inventor/hossein-hamooni-c16vlp73

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations of Hossein Hamooni

Introduction

Hossein Hamooni is an accomplished inventor based in Albuquerque, NM (US). He has made significant contributions to the field of log analytics through his innovative patent. His work focuses on enhancing the efficiency of log parsing and pattern discovery.

Latest Patents

Hossein Hamooni holds a patent titled "Fast pattern discovery for log analytics." This patent describes systems and methods for parsing logs from arbitrary or unknown systems or applications. The process involves capturing heterogeneous logs, generating unique patterns for each log message, and building a pattern hierarchy tree based on similarity metrics. The invention aims to streamline the selection of patterns from this hierarchy, improving log analysis efficiency.

Career Highlights

Hossein is currently employed at NEC Corporation, where he applies his expertise in log analytics. His innovative approach has positioned him as a valuable asset in his field. He has successfully developed methods that enhance the understanding and management of log data.

Collaborations

Some of his notable coworkers include Biplob Kumar Debnath and Jianwu Xu. Their collaboration has contributed to the advancement of technologies in log analytics.

Conclusion

Hossein Hamooni's work in log analytics exemplifies the impact of innovative thinking in technology. His patent demonstrates a commitment to improving log parsing methods, which is essential for modern data analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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