The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2021
Filed:
Nov. 15, 2016
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Biplob Debnath, Princeton, NJ (US);
Jianwu Xu, Lawrenceville, NJ (US);
Hui Zhang, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NJ (US);
Hossein Hamooni, Albuquerque, NM (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 16/31 (2019.01); G06F 17/40 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06F 16/322 (2019.01); G06F 11/34 (2013.01); G06F 17/40 (2013.01); G06K 9/4604 (2013.01);
Abstract
Systems and methods are disclosed for parsing logs from arbitrary or unknown systems or applications by capturing heterogeneous logs from the arbitrary or unknown systems or applications; generating one pattern for every unique log message; building a pattern hierarchy tree by grouping patterns based on similarity metrics, and for every group it generates one pattern by combing all constituting patterns of that group; and selecting a set of patterns from the pattern hierarchy tree.