Kahl am Main, Germany

Horst Schwiecker


Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1980-1984

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2 patents (USPTO):Explore Patents

Title: Horst Schwiecker: Innovator in Photometric Measurement Technologies

Introduction

Horst Schwiecker is a notable inventor based in Kahl am Main, Germany. He has made significant contributions to the field of photometric measurement technologies, holding 2 patents that showcase his innovative approaches.

Latest Patents

Schwiecker's latest patents include a method and photometric arrangement for measuring and controlling the thickness of optically transparent coatings during their build-up on substrates in vacuum coating installations. This method involves determining at least one reference value and at least one measured value for the transmission or reflection value of the coated object using a measuring light beam, a monochromator, a photo-receiver, an amplifier, and an analyzing circuit. Another patent focuses on an arrangement and photometer for measuring and controlling the thickness of optically active thin layers. In this arrangement, the axis of the measurement light beam is directed to the measurement object, and a referenced light receiver, independent of the optical properties of the measurement object, is associated with the measurement light beam.

Career Highlights

Throughout his career, Horst Schwiecker has worked with prominent companies such as Leybold-Heraeus GmbH and Leybold-Heraeus GmbH & Co. KG. His experience in these organizations has allowed him to develop and refine his innovative technologies in photometric measurement.

Collaborations

Schwiecker has collaborated with notable professionals in his field, including Alfons Zoller and Gernot Thorn. These collaborations have contributed to the advancement of his research and inventions.

Conclusion

Horst Schwiecker's contributions to photometric measurement technologies reflect his dedication to innovation and excellence. His patents demonstrate a commitment to improving measurement techniques in various applications.

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