The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 1984
Filed:
Aug. 25, 1982
Applicant:
Inventors:
Horst Schwiecker, Kahl am Main, DE;
Alfons Zoller, Bad-Soden Salmunster, DE;
Assignee:
Leybold-Heraeus GmbH, Cologne, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D / ; G05F / ; B05D / ;
U.S. Cl.
CPC ...
427 10 ; 356281 ; 356282 ; 356-4 ; 427-8 ;
Abstract
An arrangement for measuring and controlling the thickness of optically transparent coatings during their build-up on substrates in vacuum coating installations. The measurement is carried out by determining at least one reference value and at least one measured value for the transmission or reflection value of the coated object by using a measuring light beam, a monochromator, a photo-receiver, an amplifier and an analyzing circuit.
Schwiecker, Horst. (1984). Method of and photometric arrangement for measuring and controlling the (U.S. Patent No. 4469713). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4469713
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