This inventor holds 1 USPTO granted patent. Top assignee: Leica Microsystems Jena Gmbh. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Horst-Dieter Jaritz: Innovator in Optical Measurement Technology
Introduction
Horst-Dieter Jaritz is a notable inventor based in Jena, Germany. He has made significant contributions to the field of optical measurement technology. His innovative approach has led to advancements that enhance the accuracy and efficiency of optical measuring instruments.
Latest Patents
Horst-Dieter Jaritz holds a patent for a "Method and apparatus for monitoring the light emitted from an illumination apparatus for an optical measuring instrument." This patent describes a method for continuously sensing measurement light parameters emitted from an illumination apparatus. The sensed parameters are compared to predefined setpoints, and any deviations are signaled to initiate a lamp exchange. This system ensures optimal timing for lamp changes, maintaining consistent measurement light quality during operation.
Career Highlights
Jaritz is associated with Leica Microsystems Jena GmbH, where he applies his expertise in optical technologies. His work focuses on developing solutions that improve measurement accuracy and operational efficiency in optical instruments.
Collaborations
He has collaborated with notable colleagues such as Joachim Wienecke and Kuno Backhaus, contributing to the advancement of optical measurement technologies.
Conclusion
Horst-Dieter Jaritz's innovative work in optical measurement technology exemplifies the impact of dedicated inventors in enhancing scientific instruments. His contributions continue to influence the field positively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile