Horng-Jee Wang

Title: Inventor Spotlight: Horng-Jee Wang

Introduction

Horng-Jee Wang, an esteemed inventor based in Taipei, Taiwan, has made significant contributions to the field of technology with a notable portfolio of seven patents. His work particularly focuses on advancements that enhance electronic testing methodologies.

Latest Patents

Among his latest inventions, Wang has developed the **Integrated Compound Nano Probe Card and Method of Making Same**. This innovative probe card encompasses a substrate layer, strategically designed with compound probe pins. Each of these pins features a bundle of aligned parallel nanotubes and nanorods, coupled with a bonding material that not only secures the nanotubes but also fills the gaps between them, optimizing their functionality. The design ensures that the base end of each compound probe pin is accessible at the back side of the substrate, while the distal end remains appropriately positioned above the front side, facilitating effective electronic testing.

Career Highlights

Wang is currently associated with the Industrial Technology Research Institute, a prestigious organization known for its commitment to fostering innovations and supporting technological advancements in various fields. His dedication to research and development has positioned him as a prominent figure within the institute and the broader technological community.

Collaborations

In his endeavors, Wang collaborates with esteemed colleagues such as Min-Chieh Chou and Ya-Ru Huang. This synergy among talented individuals underscores the importance of teamwork in driving innovation and achieving groundbreaking results in their respective fields.

Conclusion

Horng-Jee Wang exemplifies the spirit of innovation that drives technological progress today. With his impactful patents and collaborative spirit, he continues to influence the realm of electronic testing, paving the way for future advancements in technology.