Industrial Technology Research Institute

Horng-Jee Wang

Min-Chieh Chou

Ya-Ru Huang

Chih-Wei Chen

Kun-Chih Pan

Jyh-Chun Chang

Ya-Ju Huang

Lih-Ren Shiue

Pei-Jen Wang

Shinn-Horng Yeh

Shu-Chin Chou

Jiu-Shu Tasi

Chu-Shu Tsai

Wen-Jin Lee

Chum-Sam Hong

An integrated compound nano probe card is disclosed to include a substrate layer having a front side and a back side, and compound probe pins arranged in the substrate layer. Each compound probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each compound probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.

Integrated compound nano probe card and method of making same

Integrated compound nano probe card

A probe module which is particularly suitable for testing an LCD panel. The probe module includes a probe base, a plurality of probe pins provided on the probe base, and a high-density circuit interconnection which includes a flexible circuit board that connects the probe pins to a testing apparatus. The tip of each probe pin may have a pointed or tapered configuration, or alternatively, a hemi-spherical configuration.

Integrated probe module for LCD panel light inspection

An integrated complex nano probe card is disclosed to include a substrate layer having a front side and a back side, and complex probe pins arranged in the substrate layer. Each complex probe pin has a bundle of aligned parallel nanotubes/nanorods and a bonding material bonded to the bundle of aligned parallel nanotubes/nanorods and filled in gaps in the nanotubes/nanorods. Each complex probe pin has a base end exposed on the back side of the substrate layer and a distal end spaced above the front side of the substrate layer.

Integrated complex nano probe card and method of making same

An integrated type probe card includes a circuit space converter having first and second contacts arranged at different density at two sides, probes connected to the contacts at one side of the circuit space converter that are arranged at a high density probes; a spring connector plate, which holds metal spring members in respective receiving holes thereof, a circuit board pressed on the metal spring members against the contacts at the other side of the circuit space converter that are arranged at a low density, and a level adjustment mechanism that accommodates the probes, the circuit space converter, the spring connector plate and the circuit board and enables the user to adjust the level status of the circuit space converter, keeping the circuit space converter electrically connected to the circuit board for transmitting test signal from the probes to the circuit board.

Integrated type probe card and its fabrication method

A method for fabricating cylindrical and prismatic rechargeable metal-air batteries is devised. The method includes using micro fans to control air flowing through the batteries via air pathways between the packs of electrodes and separator sheet. The air pathways are created by protrusions printed or molded on plastic spacer film. The air is used by the positive electrode for generating electricity when the metal-air battery is discharged. By conjunction of a second positive electrode and an energy storage device, the micro fans can be actuated as soon as the metal-air battery is demanded by a load. The in-cell air management can not only supply air for reactions but also shut the system to preserve materials when they are not in service.

In-cell air management

Growing community of inventors

Taipei, Taiwan

Horng-Jee Wang