Seoul, South Korea

Hoo Kyung Lee

This inventor holds 2 USPTO granted patents. Top assignee: Kookmin University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hoo Kyung Lee. Retrieved from https://idiyas.com/inventor/hoo-kyung-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.8

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Hoo Kyung Lee: Innovator in Object Detection and Fault Ratio Calculation

Introduction

Hoo Kyung Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the fields of object detection and fault ratio calculation through his innovative patents. With a total of 2 patents, Lee continues to push the boundaries of technology and research.

Latest Patents

Hoo Kyung Lee's latest patents include a method and apparatus for detecting an object based on identification information of the object in continuous images. This object detection method involves acquiring identification information from multiple images captured in sequence and correcting the identification information based on earlier images. His second patent is an apparatus and method for calculating the ratio of fault based on a 3D simulator. This method utilizes image frames from a vehicle's camera to generate a driving route and simulate various driving scenarios to compute fault ratios related to traffic accidents.

Career Highlights

Lee is affiliated with Kookmin University, where he contributes to research and development in his areas of expertise. His work has garnered attention for its practical applications in enhancing safety and efficiency in vehicle operations.

Collaborations

Some of Hoo Kyung Lee's notable coworkers include Jin Woo Yoo and Jin Gwan Kim, who collaborate with him on various research projects.

Conclusion

Hoo Kyung Lee's innovative work in object detection and fault ratio calculation exemplifies the impact of research and technology on real-world applications. His contributions continue to advance the fields he is involved in.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…