The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2025

Filed:

Apr. 26, 2022
Applicant:

Kookmin University Industry Academy Cooperation Foundation, Seoul, KR;

Inventors:

Jin Woo Yoo, Seoul, KR;

Jin Gwan Kim, Seoul, KR;

Dong Sun Lim, Seoul, KR;

Hoo Kyung Lee, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); B60W 40/09 (2012.01); G01C 21/34 (2006.01); G06F 18/214 (2023.01); G06N 3/02 (2006.01); G06N 3/042 (2023.01); G01C 21/28 (2006.01);
U.S. Cl.
CPC ...
B60W 40/09 (2013.01); G01C 21/3461 (2013.01); G06F 18/214 (2023.01); B60W 2420/403 (2013.01); G01C 21/28 (2013.01); G01C 21/34 (2013.01); G06N 3/02 (2013.01); G06N 3/042 (2023.01);
Abstract

This application relates to a device and a method for calculating a fault ratio. The method may include by using image frames collected from a camera of a first vehicle, generating a driving route in which the first vehicle travels, and acquiring fault information of a traffic accident involving a second vehicle, the traffic accident being related to the driving route of the first vehicle. The method may also include changing factors related to braking or steering of the first vehicle and the second vehicle, and generating multiple simulation driving scenarios by simulating the driving route on the basis of the changed factors. The method may further include computing a fault ratio of the first vehicle and the second vehicle for each of the multiple simulation driving scenarios by correcting the fault information on the basis of the factors.


Find Patent Forward Citations

Loading…