Hongji Sun

Title: Innovations of Hongji Sun in Defect Detection Technology

Introduction

Hongji Sun is a notable inventor based in Ningde, China. He has made significant contributions to the field of defect detection technology, particularly in the context of cell surfaces. His innovative approach has led to the development of a patented method that enhances the accuracy and efficiency of defect detection.

Latest Patents

Hongji Sun holds a patent for a "Method and apparatus for detecting defect on surface of cell." This invention involves obtaining an initial image of the cell's surface using an image acquisition unit. The initial image is then preprocessed to produce at least one image for defect detection. This image is input into a defect detection neural network model, which outputs a detection result indicating whether a defect exists on the cell's surface. The technical solutions provided in this patent allow for the prominent highlighting of defect features in the image, facilitating subsequent detection by the neural network model. This innovation improves both the efficiency and accuracy of defect detection.

Career Highlights

Throughout his career, Hongji Sun has worked with prominent companies in the technology sector. He has been associated with Contemporary Amperex Technology (Hong Kong) Limited and Contemporary Amperex Technology Limited. His work in these organizations has contributed to advancements in battery technology and defect detection systems.

Collaborations

Hongji Sun has collaborated with notable colleagues, including Fei Chen and Guannan Jiang. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Hongji Sun's contributions to defect detection technology exemplify the impact of innovative thinking in the field. His patented methods not only enhance the detection process but also pave the way for future advancements in technology.