Contemporary Amperex Technology (hong Kong) Limited

Contemporary Amperex Technology Limited

Hongji Sun

Guannan Jiang

Fei Chen

A method and apparatus for detecting a defect on a surface of a cell, including: obtaining an initial image of the surface of the cell by using an image acquisition unit; preprocessing the initial image to obtain at least one image to be detected of the surface of the cell; and inputting the at least one image to be detected into a defect detection neural network model, and obtaining a detection result outputted by the defect detection neural network model, the detection result being used to indicate whether there is a defect on the surface of the cell is described. According to technical solutions, features of the defect in the image may be made prominent, so as to facilitate subsequent detection of the defect detection neural network model; and more features may be extracted from the image, thereby improving the efficiency and accuracy of defect detection.

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Ningde, China

Hongji Sun