Company Filing History:
1 out of 120 
1 out of 516 
Years Active: 2004-2013
Title: Holger Nissle: Innovator in Scanning Microscopy
Introduction
Holger Nissle is a prominent inventor based in Heidelberg, Germany. He has made significant contributions to the field of microscopy, particularly through his innovative methods and devices. With a total of 2 patents, Nissle's work has advanced the capabilities of scanning microscopy.
Latest Patents
Nissle's latest patents include a method and device for scanning-microscopy imaging of a specimen. This invention describes a process where multiple specimen points are scanned using a scanning beam in successive time intervals. The intensity of the radiation emitted from each scanned specimen point is repeatedly measured within the associated time interval. An intensity mean value is then determined, creating a mean value image point signal, which is assembled into a mean value raster image. Additionally, the invention allows for the determination of an intensity variance value, which is compiled into a variance raster image signal. Another notable patent involves an apparatus for determining the light power level of a light beam. This apparatus features a beam splitter and a detector, ensuring that the ratio between the light power levels remains constant over time.
Career Highlights
Throughout his career, Holger Nissle has worked with esteemed companies such as Leica Microsystems Heidelberg GmbH and Leica Microsystems CMS GmbH. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in microscopy technology.
Collaborations
Nissle has collaborated with notable professionals in his field, including Holger Birk and Heinrich Ulrich. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Holger Nissle's contributions to scanning microscopy through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence advancements in microscopy techniques and applications.