Leica Microsystems Cms Gmbh

Leica Microsystems Heidelberg Gmbh

Holger Nissle

Holger Birk

Bernd Widzgowski

Heinrich Ulrich

William C Hay

A method and a device for scanning-microscopy imaging of a specimen () are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam () in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.

Method and device for scanning-microscopy imaging of a specimen

An apparatus for determining the light power level of a light beam ( ), having a beam splitter ( ) and a detector ( ) associated with the beam splitter ( ), is disclosed. The apparatus is characterized in that the beam splitter ( ) splits measuring light ( ) out of the light beam and conveys it to the detector ( ), and that the ratio between the light power level of the light beam ( ) and the light power level of the measuring light ( ) measured at the detector ( ) is constant over time.

Growing community of inventors

Heidelberg, Germany

Holger Nissle