The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Jan. 11, 2012
Holger Birk, Meckesheim, DE;
Bernd Widzgowski, Dossenheim, DE;
Holger Nissle, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A method and a device for scanning-microscopy imaging of a specimen () are described. Provision is made that a plurality of specimen points are scanned by means of a scanning beam () in successive scanning time intervals, the intensity of the radiation emitted from the respectively scanned specimen point is repeatedly sensed within the associated scanning time interval, an intensity mean value is determined, as a mean value image point signal, from the intensities sensed in the respectively scanned specimen point, and the mean value image point signals are assembled into a mean value raster image. Provision is further made for additionally determining an intensity variance value, as a variance image point signal, from the intensities sensed in the respectively scanning specimen points, and for assembling the variance image point signals into a variance raster image signal.