Sapporo City, Hokkaido, Japan

Hitoshi Yonemichi

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Tokyo Electron Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoshi Yonemichi. Retrieved from https://idiyas.com/inventor/hitoshi-yonemichi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hitoshi Yonemichi: Innovator in Data Processing Technology

Introduction

Hitoshi Yonemichi is a prominent inventor based in Sapporo City, Hokkaido, Japan. He has made significant contributions to the field of data processing, particularly in imaging time series data of multiple wavelengths. His innovative work has led to the development of a patented technology that enhances data processing capabilities.

Latest Patents

Hitoshi Yonemichi holds a patent for a "Data Processing Apparatus and Method for Imaging Time Series Data of Multiple Wavelengths." This invention represents a breakthrough in the way data is processed and analyzed, showcasing his expertise in the field.

Career Highlights

He is currently employed at Tokyo Electron Limited, a leading company in the semiconductor and electronics industry. His role at the company allows him to apply his innovative ideas and contribute to advancements in technology.

Collaborations

Hitoshi has collaborated with notable colleagues, including Hisanori Sakai and Takeshi Akimoto. Their teamwork has fostered an environment of innovation and creativity, leading to impactful developments in their respective fields.

Conclusion

Hitoshi Yonemichi is a distinguished inventor whose work in data processing technology has made a significant impact. His contributions continue to influence advancements in the industry, and his collaborations with talented colleagues further enhance his innovative efforts.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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