Ikeda, Japan

Hitoshi Umezawa

This inventor holds 1 USPTO granted patent. Top assignee: Ookuma Diamond Device Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoshi Umezawa. Retrieved from https://idiyas.com/inventor/hitoshi-umezawa-rnu8o8is

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hitoshi Umezawa and Diamond Semiconductor Innovation.

Introduction

Hitoshi Umezawa is an inventor associated with Ikeda, Japan, and Ookuma Diamond Device Inc. His work includes a patent for a diamond-based field-effect transistor designed to maintain performance after X-ray exposure.

Latest Patents

The provided information identifies one patent associated with Umezawa: “Field effect transistor.” The invention uses a hydrogen-terminated, non-doped diamond layer, p+ diamond layers, source and drain electrodes, an insulating layer, and a gate electrode. Its stated design achieves a mutual conductance of at least 0.5 mS/mm at room temperature after exposure to 5 MGy of X-rays. The record lists 1 patent.

Career Highlights

Umezawa’s listed patent focuses on diamond semiconductor technology and radiation tolerance. The described transistor structure combines diamond layers and a gate arrangement intended to preserve electrical performance under substantial X-ray exposure.

Collaborations

The provided information names Junichi Kaneko and Hitoshi Koizumi as Umezawa’s coworkers. It does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Hitoshi Umezawa’s listed invention highlights a diamond-based transistor design with a stated focus on maintaining mutual conductance after X-ray exposure.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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