Osaka, Japan

Hitoo Iwasa

This inventor holds 1 USPTO granted patent. Top assignee: Aac Technologies Japan R&d Center Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoo Iwasa. Retrieved from https://idiyas.com/inventor/hitoo-iwasa-pv7p3gg3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Hitoo Iwasa: Innovator in Solid State Image Technology

Introduction

Hitoo Iwasa is a prominent inventor based in Osaka, Japan. He is known for his significant contributions to the field of image pickup devices. His innovative work has led to advancements that enhance production yield and reliability in imaging technology.

Latest Patents

Hitoo Iwasa holds a patent for a solid state image pick-up device and a method for manufacturing the same with increased structural integrity. This invention is characterized by a large number of light-receiving portions formed at the surface of a wafer. It includes microlenses for each light-receiving portion, through electrodes for power supply, and a protective frame that enhances the device's durability.

Career Highlights

Iwasa is currently associated with Aac Technologies Japan R&D Center Co., Ltd. His work focuses on developing advanced imaging technologies that are crucial for various applications in the electronics industry. His patent reflects his commitment to improving the efficiency and reliability of image capture systems.

Collaborations

Hitoo Iwasa has collaborated with notable colleagues such as Sumio Terakawa and Masami Shouji. These partnerships have contributed to the innovative advancements in the field of imaging technology.

Conclusion

Hitoo Iwasa's contributions to solid state image technology exemplify the impact of innovation in enhancing device performance and reliability. His work continues to influence the future of imaging systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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