Hisatoshi Kashino

Title: Hisatoshi Kashino: Innovator in C-V Characteristic Measurement Systems

Introduction

Hisatoshi Kashino is a notable inventor based in Gunma, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of C-V characteristics. His innovative approach has led to advancements that improve the accuracy and reliability of measurements in single crystal silicon wafers.

Latest Patents

Hisatoshi Kashino holds a patent for a C-V characteristic measurement system and method. This invention allows for less change in resistivity over time during repeated measurements of a single crystal silicon wafer using a mercury electrode. The system includes a mercury probe for electrode contact, an LCR meter for applying a reverse bias voltage, analysis software for calculating C-V characteristics, and a static electricity removing device. This comprehensive approach enhances the precision of C-V measurements.

Career Highlights

Kashino is currently employed at Shin-Etsu Handotai Co., Ltd., where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in advancing measurement techniques that are critical for the semiconductor industry.

Collaborations

Hisatoshi Kashino collaborates with Fumitaka Kume, contributing to the development of cutting-edge technologies in their field. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Hisatoshi Kashino's contributions to C-V characteristic measurement systems demonstrate his commitment to advancing semiconductor technology. His innovative methods and collaborative efforts continue to impact the industry positively.