This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: National Printing Bureau, Incorporated Administrative Agency. Active years: 2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011
Title: Hisashi Kato: Innovator in Optical Variable Device Inspection
Introduction
Hisashi Kato is a notable inventor based in Odawara, Japan. He has made significant contributions to the field of optical variable devices, particularly in the inspection methods and apparatuses used to ensure the quality of these devices.
Latest Patents
Hisashi Kato holds 1 patent for an innovative method and apparatus for inspecting defects and attachment positions of optical variable devices (OVD). This patent addresses the challenges posed by changes in the pattern of the OVD due to fluttering or undulation during the conveyance of printed products. The inspection method utilizes image input means and illumination means strategically arranged to minimize interference from mirror reflected light and diffracted light. The image processing means executes a binarization process, comparing image data with reference data to determine the acceptability of the OVD's form, area, and position.
Career Highlights
Kato is currently employed at the National Printing Bureau, an Incorporated Administrative Agency in Japan. His work focuses on enhancing the reliability and accuracy of OVD inspection processes, contributing to advancements in security printing technologies.
Collaborations
Hisashi Kato collaborates with Shinichi Suzuki, a fellow innovator in the field. Their partnership aims to further develop and refine inspection techniques for optical variable devices.
Conclusion
Hisashi Kato's contributions to the field of optical variable device inspection highlight his innovative spirit and dedication to quality assurance in printing technologies. His work continues to influence advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile