Hyogo, Japan

Hisanori Date

This inventor holds 1 USPTO granted patent. Top assignee: Keisuugiken Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisanori Date. Retrieved from https://idiyas.com/inventor/hisanori-date

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hisanori Date and Patent Innovation in Monitoring Technology.

Introduction

Hisanori Date is an inventor associated with Hyogo, Japan. His work includes a patented monitoring technology designed to detect abnormalities in images of monitored targets. He is associated with Keisuugiken Corporation and has collaborated with Naohiro Hayaishi.

Latest Patents

Date is listed as an inventor on 1 patent: “Monitoring Device, Monitoring Method, and Program.” The invention acquires an image of a monitoring target, determines the target’s type, and applies a monitoring model suited to that type to detect abnormalities. When an abnormality is detected, the system outputs a related notification or result. By selecting a model according to the target shown in the image, the technology supports monitoring tailored to the observed target.

Career Highlights

A key highlight of Date’s patent work is the integration of image acquisition, target classification, and model-based abnormality detection in a single monitoring process. His association with Keisuugiken Corporation connects his inventive work with the company’s technology activities.

Collaborations

Date’s listed coworker is Naohiro Hayaishi. Their association reflects a collaborative context for the monitoring invention.

Conclusion

Hisanori Date’s patent describes an adaptive monitoring approach that selects an appropriate detection model based on the type of target captured, supporting more targeted abnormality detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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