The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2026
Filed:
Sep. 15, 2020
Keisuugiken Corporation, Osaka, JP;
Hisanori Date, Hyogo, JP;
Naohiro Hayaishi, Osaka, JP;
KEISUUGIKEN CORPORATION, Osaka, JP;
Abstract
The monitoring device includes a captured image acquisition unit that captures a captured image of a monitoring target, a determination unit that determines a type of the monitoring target included in the captured image, an abnormality detection unit that detects an abnormality by applying the captured image to a monitoring model corresponding to the type of the monitoring target determined by the determination unit, the monitoring model being used to detect an abnormality related to the monitoring target included in the captured image, and an output unit that, when the abnormality is detected by the abnormality detection unit, performs an output related to detection of the abnormality. With such a configuration, it is possible to detect an abnormality using the monitoring model corresponding to the type of the monitoring target included in the captured image, and it is possible to perform abnormality detection according to the actually captured monitoring target.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile