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For the Inventor, By the Inventor

Kawasaki, Japan

Hiroyuki Tsukahara

This inventor holds 12 USPTO granted patents and 2 published patent applications. Top assignee: Fujitsu Corporation. Active years: 1987-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Tsukahara. Retrieved from https://idiyas.com/inventor/hiroyuki-tsukahara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 12 

% Patents Active = 91.7

Average Co-Inventor Count = 3.7

ph-index = 8

Forward Citations = 264(Granted Patents)


Location History:

  • Atsugi, JP (1987 - 1994)
  • Kawasaki, JP (1999 - 2009)

Company Filing History:

goldMedal12 out of 39,374 
 
Fujitsu Corporation
 patents

Years Active: 1987-2009

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12 patents (USPTO):Explore Patents
1. 7593596 - Phase unwrapping method, program, and interference measurement apparatus (2009-09-22),
2. 7443516 - Optical-distortion correcting apparatus and optical-distortion correcting method (2008-10-28),
3. 6555836 - Method and apparatus for inspecting bumps and determining height from a regular reflection region (2003-04-29),
4. 6104493 - Method and apparatus for visual inspection of bump array (2000-08-15),
5. 6052189 - Height measurement device and height measurement method (2000-04-18),
6. 5999266 - Method for inspecting height, and a height inspection apparatus to carry (1999-12-07),
7. 5298989 - Method of and apparatus for multi-image inspection of bonding wire (1994-03-29),
8. 5243406 - Method and apparatus for measuring three-dimensional configuration of (1993-09-07),
9. 5004929 - Optical system for detecting three-dimensional shape (1991-04-02),
10. 4805224 - Pattern matching method and apparatus (1989-02-14),
11. 4672678 - Pattern recognition apparatus (1987-06-09),
12. 4651341 - Pattern recognition apparatus and a pattern recognition method (1987-03-17),

Title: Hiroyuki Tsukahara: Innovator in Optical Measurement Technologies

Introduction

Hiroyuki Tsukahara is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of optical measurement technologies, holding a total of 12 patents. His work focuses on advanced methods for phase unwrapping and optical distortion correction, which are crucial for various applications in imaging and measurement.

Latest Patents

Tsukahara's latest patents include a phase unwrapping method, program, and interference measurement apparatus. This innovative technology involves a candidate pixel generating unit that searches for adjacent pixels to generate candidate pixels with corrected phase differences. The registration control unit plays a vital role in organizing these pixels based on their weight, ensuring efficient processing. Another notable patent is an optical-distortion correcting apparatus and method. This invention calculates the original height of a distortion detecting mirror and corrects distortions based on a correction table, enhancing the accuracy of optical measurements.

Career Highlights

Hiroyuki Tsukahara has built a successful career at Fujitsu Corporation, where he has been instrumental in developing cutting-edge technologies. His expertise in optical measurement has positioned him as a key figure in the industry, contributing to advancements that improve measurement accuracy and efficiency.

Collaborations

Throughout his career, Tsukahara has collaborated with talented individuals such as Yoshitaka Oshima and Fumiyuki Takahashi. These partnerships have fostered innovation and have led to the successful development of various technologies in the field.

Conclusion

Hiroyuki Tsukahara's contributions to optical measurement technologies through his patents and work at Fujitsu Corporation highlight his role as a leading inventor in this field. His innovative approaches continue to influence advancements in optical measurement and correction methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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